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Defect induced the surface enhanced Raman scattering of MoO3-xthin films by thermal treatment
Qiankun Huang; Qingyou Liu; Xiao Li; Ruijin Hong; Chunxian Tao; Qi Wang; Hui Lin; Zhaoxia Han; Dawei Zhang
2022
Source PublicationMaterials Today Communications
Volume33Pages:105025
Abstract

 

 

DOI10.1016/j.mtcomm.2022.105025
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Indexed BySCI
Language英语
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Cited Times:2[WOS]   [WOS Record]     [Related Records in WOS]
Document Type期刊论文
Identifierhttp://ir.gyig.ac.cn/handle/42920512-1/13717
Collection地球内部物质高温高压实验室
地球深部物质与流体作用地球化学研究室
Affiliation1.Engineering Research Center of Optical Instrument and System, Ministry of Education and Shanghai Key Lab of Modern Optical System, University of Shanghai for Science and Technology, No.516 Jungong Road, Shanghai 200093, China
2.Key Laboratory of High-temperature and High-pressure Study of the Earth’s Interior, Institute of Geochemistry, Chinese Academy of Sciences, Guiyang 550081, China
3.Department of Physics, Beijing Technology and Business University, Beijing 100048, China
Recommended Citation
GB/T 7714
Qiankun Huang,Qingyou Liu,Xiao Li,et al. Defect induced the surface enhanced Raman scattering of MoO3-xthin films by thermal treatment[J]. Materials Today Communications,2022,33:105025.
APA Qiankun Huang.,Qingyou Liu.,Xiao Li.,Ruijin Hong.,Chunxian Tao.,...&Dawei Zhang.(2022).Defect induced the surface enhanced Raman scattering of MoO3-xthin films by thermal treatment.Materials Today Communications,33,105025.
MLA Qiankun Huang,et al."Defect induced the surface enhanced Raman scattering of MoO3-xthin films by thermal treatment".Materials Today Communications 33(2022):105025.
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